Trademarks

The most important statistical data can be found in the Institute's latest annual report. Other statistical data can be requested via the Contact-Center.

    

OECD: patent statistics and comparative studies, allowing mapping aspects of the innovative performance of regions or specific technology domains are also published by the OECD.

PATSTAT (EPO): this database, produced by the European Patent Office, is designed to be used for statistical research.

  
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